Ralf Thomann
Jan. 2005
Energy Filter Transmission Electron Microscope
electron spectroscopic imaging (ESI)
electron energy loss spectroscopy (EELS)
digital STEM attachment (DSA)
energy dispersive X-ray system (EDX)
BF/DF measurements
Cryo-TEM
in-situ TEM resolution : 0.37 nm
Voltage : 60-120 kV
Magnification : 80-500000x